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You searched for: Author/Creator Chappert, C.Limit your search
- Chappert, C. [remove] 1
- 621.381 1
- CMOS memory circuits -- magnetic tunnelling -- Monte Carlo methods -- random‐access storage -- semiconductor device reliability 1
- Electronics -- Periodicals 1
- high reliability sensing circuit -- deep submicron spin transfer torque magnetic random access memory -- triple‐stage sensing operation -- deep submicron nodes -- bit‐line voltage -- predefined small bias voltage -- STMicroelectronics CMOS design kit -- STT‐MTJ compact model -- Monte Carlo simulations 1