Author/Creator: Caymax, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Caymax, M.

1. Comparison between Si/SiO2 mid‐gap interface states and deep levels associated with silicon‐oxygen superlattices in p‐type silicon. Issue 10 (13th May 2016)

Authors:: Simoen, Eddy; Jayachandran, S.; Delabie, A.; Caymax, M.; Heyns, M.
Journal:: Physica status solidi
Issue:: Volume 13:Issue 10-12(2016)
Page Start:: 718
Record Type:: Journal Article
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2. Low temperature deposition of 2D WS2 layers from WF6 and H2S precursors: impact of reducing agents. Issue 86 (14th September 2015)

Authors:: Delabie, A.; Caymax, M.; Groven, B.; Heyne, M.; Haesevoets, K.; Meersschaut, J.; Nuytten, T.; Bender, H.; Conard, T.; Verdonck, P.; Van Elshocht, S.; De Gendt, S.; Heyns, M.; Barla, K.; Radu, I.; Thean, A.
Journal:: Chemical communications
Issue:: Volume 51:Issue 86(2015)
Page Start:: 15692
Record Type:: Journal Article
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3. Multilayer MoS2 growth by metal and metal oxide sulfurization. Issue 6 (18th January 2016)

Authors:: Heyne, M. H.; Chiappe, D.; Meersschaut, J.; Nuytten, T.; Conard, T.; Bender, H.; Huyghebaert, C.; Radu, I. P.; Caymax, M.; de Marneffe, J.-F.; Neyts, E. C.; De Gendt, S.
Journal:: Journal of materials chemistry
Issue:: Volume 4:Issue 6(2016)
Page Start:: 1295
Record Type:: Journal Article
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4. Nucleation Behavior of III/V Crystal Selectively Grown Inside Nano-Scale Trenches: The Influence of Trench Width. (1st January 2015)

Authors:: Jiang, S.; Merckling, C.; Moussa, A.; Waldron, N.; Caymax, M.; Vandervorst, W.; Collaert, N.; Barla, K.; Langer, R.; Thean, A.; Seefeldt, M.; Heyns, M.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 4:Number 7(2015)
Page Start:: N83
Record Type:: Journal Article
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5. Nucleation Behavior of III/V Crystal Selectively Grown Inside Nano-Scale Trenches: The Influence of Trench Width. (22nd May 2015)

Authors:: Jiang, S.; Merckling, C.; Moussa, A.; Waldron, N.; Caymax, M.; Vandervorst, W.; Collaert, N.; Barla, K.; Langer, R.; Thean, A.; Seefeldt, M.; Heyns, M.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 4:Number 7(2015)
Page Start:: N83
Record Type:: Journal Article
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6. Review—Device Assessment of Electrically Active Defects in High-Mobility Materials. (1st January 2016)

Authors:: Claeys, C.; Simoen, E.; Eneman, G.; Ni, K.; Hikavyy, A.; Loo, R.; Gupta, S.; Merckling, C.; Alian, A.; Caymax, M.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 5:Number 4(2016)
Page Start:: P3149
Record Type:: Journal Article
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7. Review—Device Assessment of Electrically Active Defects in High-Mobility Materials. (28th January 2016)

Authors:: Claeys, C.; Simoen, E.; Eneman, G.; Ni, K.; Hikavyy, A.; Loo, R.; Gupta, S.; Merckling, C.; Alian, A.; Caymax, M.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 5:Number 4(2016)
Page Start:: P3149
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗