1. (Invited) Tensile Strain Engineering and Defects Management in GeSn Laser Cavities. (8th September 2020) Authors: EL Kurdi, Moustafa; Elbaz, Anas; Wang, Binbin; Sakat, Emilie; Herth, Etienne; Patriarche, Gilles; Pantzas, Konstantinos; Sagnes, Isabelle; Sauvage, Sebastien; Checoury, Xavier; Chelnokov, Alexei; Reboud, Vincent; Chretien, Jeremie; Pauc, Nicolas; Calvo, Vincent; Boeuf, Frédéric; Boucaud, Philippe... Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Dielectric Coating‐Induced Absorption Enhancement in Si Nanowire Junctions. Issue 1 (10th November 2014) Authors: Solanki, Amit; Gentile, Pascal; Boutami, Salim; Calvo, Vincent; Pauc, Nicolas Journal: Advanced optical materials Issue: Volume 3:Issue 1(2015:Jan.) Page Start: 120 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Experimental Calibration of Sn‐Related Varshni Parameters for High Sn Content GeSn Layers. Issue 6 (12th February 2019) Authors: Bertrand, Mathieu; Thai, Quang‐Minh; Chrétien, Jérémie; Pauc, Nicolas; Aubin, Joris; Milord, Laurent; Gassenq, Alban; Hartmann, Jean‐Michel; Chelnokov, Alexei; Calvo, Vincent; Reboud, Vincent Other Names: Ruffenach Sandra guestEditor.; Tchernycheva Maria guestEditor. Journal: Annalen der Physik Issue: Volume 531:Issue 6(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. High aspect ratio germanium nanowires obtained by dry etching. Issue 13 (2016) Authors: Guilloy, Kevin; Pauc, Nicolas; Gassenq, Alban; Calvo, Vincent Journal: MRS advances Issue: Volume 1:Issue 13(2016) Page Start: 875 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering. Issue 5 (4th August 2016) Authors: Tardif, Samuel; Gassenq, Alban; Guilloy, Kevin; Pauc, Nicolas; Osvaldo Dias, Guilherme; Hartmann, Jean-Michel; Widiez, Julie; Zabel, Thomas; Marin, Esteban; Sigg, Hans; Faist, Jérôme; Chelnokov, Alexei; Reboud, Vincent; Calvo, Vincent; Micha, Jean-Sébastien; Robach, Odile; Rieutord, François Journal: Journal of applied crystallography Issue: Volume 49:Issue 5(2016) Page Start: 1402 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗