1. DC and RF characterization of InGaAs replacement metal gate (RMG) nFETs on SiGe-OI FinFETs fabricated by 3D monolithic integration. (February 2017) Authors: Deshpande, V.; Djara, V.; O'Connor, E.; Hashemi, P.; Balakrishnan, K.; Caimi, D.; Sousa, M.; Czornomaz, L.; Fompeyrine, J. Journal: Solid-state electronics Issue: Volume 128(2017) Page Start: 87 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. III-V-on-Si transistor technologies: Performance boosters and integration. (November 2021) Authors: Caimi, D.; Schmid, H.; Morf, T.; Mueller, P.; Sousa, M.; Moselund, K.E.; Zota, C.B. Journal: Solid-state electronics Issue: Volume 185(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗