Date: 2016 / Author/Creator: Cacho, F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Date 2016 Author/Creator Cacho, F.

1. Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. (September 2016)

Authors:: Ndiaye, C.; Huard, V.; Federspiel, X.; Cacho, F.; Bravaix, A.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 158
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. (September 2016)

Authors:: Ndiaye, C.; Huard, V.; Federspiel, X.; Cacho, F.; Bravaix, A.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 158
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (September 2016)

Authors:: Bravaix, A.; Cacho, F.; Federspiel, X.; Ndiaye, C.; Mhira, S.; Huard, V.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 163
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (September 2016)

Authors:: Bravaix, A.; Cacho, F.; Federspiel, X.; Ndiaye, C.; Mhira, S.; Huard, V.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 163
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗