1. Characterization of Low Drop-Out during ageing and design for yield. (September 2017) Authors: Lajmi, R.; Cacho, F.; Lauga Larroze, E.; Bourdel, S.; Benech, P.; Huard, V.; Federspiel, X. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 92 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Enabling robust automotive electronic components in advanced CMOS nodes. (September 2017) Authors: Huard, V.; Mhira, S.; Cacho, F.; Bravaix, A. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 13 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Modeling hot carrier damage interaction between on and off modes for 28 nm AC RF applications. (November 2021) Authors: Garba-Seybou, T.; Bravaix, A.; Federspiel, X.; Cacho, F. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. (September 2016) Authors: Ndiaye, C.; Huard, V.; Federspiel, X.; Cacho, F.; Bravaix, A. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 158 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. (September 2016) Authors: Ndiaye, C.; Huard, V.; Federspiel, X.; Cacho, F.; Bravaix, A. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 158 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (September 2016) Authors: Bravaix, A.; Cacho, F.; Federspiel, X.; Ndiaye, C.; Mhira, S.; Huard, V. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 163 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. (September 2016) Authors: Bravaix, A.; Cacho, F.; Federspiel, X.; Ndiaye, C.; Mhira, S.; Huard, V. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 163 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Temperature dependence of TDDB at high frequency in 28FDSOI. (September 2019) Authors: Arabi, M.; Federspiel, X.; Cacho, F.; Rafik, M.; Nguyen, A.-P.; Garros, X.; Ghibaudo, G. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗