Author/Creator: Butzen, P.F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Butzen, P.F.

1. Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. (September 2018)

Authors:: Almeida, R.B.; Marques, C.M.; Butzen, P.F.; Silva, F.R.G.; Reis, R.A.L.; Meinhardt, C.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 196
Record Type:: Journal Article
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2. Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation. (November 2020)

Authors:: Schvittz, R.B.; Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Rosa, L.S.; Butzen, P.F.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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3. Reliable majority voter based on spin transfer torque magnetic tunnel junction device. Issue 1 (1st January 2016)

Authors:: Butzen, P.F.; Slimani, M.; Wang, Y.; Cai, H.; Naviner, L.A.B.
Journal:: Electronics letters
Issue:: Volume 52:Issue 1(2016)
Page Start:: 47
Record Type:: Journal Article
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4. Single event transient sensitivity analysis of different 32 nm CMOS majority voters designs. (September 2019)

Authors:: Oliveira, I.F.V.; Schvittz, R.B.; Butzen, P.F.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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