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- Buse, Ben [remove] 18
- 502.82 18
- Microchemistry -- Periodicals 18
- Microscopy -- Periodicals 18
- aluminum, -- copper, -- bismuth, -- thin film, -- film thickness 1
- carbon -- EPMA -- mass absorption coefficient -- uranium 1
- carbon erosion -- low voltage -- electron probe microanalysis -- thin film -- coating 1
- coating, -- EPMA, -- oxide, -- thin film 1
- electron probe microanalysis -- secondary ion mass spectrometry -- semiconductor analysis -- silicon doping -- trace-element analysis 1
- electron probe microanalysis, -- anticontamination, -- Peltier cooling, -- cold finger, -- carbon contamination 1
- electron probe microanalysis, -- scanning electron microscopy, -- phase mapping, -- K-means clustering, -- elemental maps 1