Author/Creator: Buffolo, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Buffolo, M.

11. Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress. (September 2018)

Authors:: Renso, N.; Buffolo, M.; De Santi, C.; Ronzani, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 887
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

12. Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon. (November 2022)

Authors:: Zenari, M.; Buffolo, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Herrick, R.W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

13. Long-term degradation mechanisms of mid-power LEDs for lighting applications. Issue 9 (August 2015)

Authors:: Buffolo, M.; De Santi, C.; Meneghini, M.; Rigon, D.; Meneghesso, G.; Zanoni, E.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1754
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

14. Understanding the degradation processes of GaN based LEDs submitted to extremely high current density. (September 2017)

Authors:: Renso, N.; Meneghini, M.; Buffolo, M.; De Santi, C.; Meneghesso, G.; Zanoni, E.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 556
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗