1. Uncertainty analysis for material measurements using the vector network analyzer. Issue 8 (27th May 2016) Authors: Shoaib, Nosherwan; Sellone, Marco; Brunetti, Luciano; Oberto, Luca Journal: Microwave and optical technology letters Issue: Volume 58:Issue 8(2016:Aug.) Page Start: 1841 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗