Uncertainty analysis for material measurements using the vector network analyzer. Issue 8 (27th May 2016)

• Record Type: Journal Article
• Authors: Shoaib, Nosherwan; Sellone, Marco; Brunetti, Luciano; Oberto, Luca
• Is Part Of: Microwave and optical technology letters. Volume 58:Issue 8(2016:Aug.)
• Page Start: 1841
• Page End: 1844
• Publication Date: 2016-05-27
• Subjects: microwave measurements -- scattering parameter measurements -- relative permittivity -- dielectric constant -- vector network analyzer uncertainty evaluation; Microwaves -- Periodicals; Optics -- Periodicals; 621
• DOI: 10.1002/mop.29917
• Languages: English
• ISSNs: 0895-2477

Abstract

ABSTRACT: This article presents the characterization measurements and related uncertainty evaluation of a non‐magnetic material using the Vector Network Analyzer (VNA) at microwave frequencies. The permittivity of the material under test is computed from the scattering parameters (S‐parameters). The aim of the work is to highlight the different uncertainty contributions affecting the permittivity. © 2016 Wiley Periodicals, Inc. Microwave Opt Technol Lett 58:1841–1844, 2016