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Author/Creator Botella, Claude

1. Epitaxial Growth of Ferroelectric Pb(Zr, Ti)O3 Layers on GaAs. Issue 1675 (2014)

Authors:
Meunier, Benjamin; Louahadj, Lamis; Le Bourdais, David; Largeau, Ludovic; Agnus, Guillaume; Lecoeur, Philippe; Pillard, Valérie; Mazet, Lucie; Bachelet, Romain; Regreny, Philippe; Botella, Claude; Grenet, Geneviève; Albertini, David; Dubourdieu, Catherine; Gautier, Brice; Saint-Girons, Guillaume
Editors:
Craciun, V.; Guilloux-Viry, M.; Jain, M.; Jia, Q.; Kozuka, H.; Kumar, D.; Mathur, S.; Obradors, X.; Singh, K.K.
Journal:
MRS proceedings
Issue:
Issue 1675:(2014)
Page Start:
93
Record Type:
Journal Article
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2. Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO3 based solid solutions. Issue 11 (2nd March 2021)

Authors:
Razaghi Pey Ghaleh, Masoumeh; d'Esperonnat, Marc; Botella, Claude; Cueff, Sébastien; Bachelet, Romain; Saint-Girons, Guillaume
Journal:
CrystEngComm
Issue:
Volume 23:Issue 11(2021)
Page Start:
2269
Record Type:
Journal Article
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3. Thermoelectric La-doped SrTiO3 epitaxial layers with single-crystal quality: from nano to micrometers. Issue 1 (1st January 2017)

Authors:
Apreutesei, Mihai; Debord, Régis; Bouras, Mohamed; Regreny, Philippe; Botella, Claude; Benamrouche, Aziz; Carretero-Genevrier, Adrian; Gazquez, Jaume; Grenet, Geneviève; Pailhès, Stéphane; Saint-Girons, Guillaume; Bachelet, Romain
Journal:
Science and technology of advanced materials
Issue:
Volume 18:Issue 1(2017)
Page Start:
430
Record Type:
Journal Article
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4. Thermoelectric La-doped SrTiO3 epitaxial layers with single-crystal quality: from nano to micrometers. Issue 1 (31st December 2017)

Authors:
Apreutesei, Mihai; Debord, Régis; Bouras, Mohamed; Regreny, Philippe; Botella, Claude; Benamrouche, Aziz; Carretero-Genevrier, Adrian; Gazquez, Jaume; Grenet, Geneviève; Pailhès, Stéphane; Saint-Girons, Guillaume; Bachelet, Romain
Journal:
Science and technology of advanced materials
Issue:
Volume 18:Issue 1(2017)
Page Start:
430
Record Type:
Journal Article
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5. X‐ray‐induced degradation of OEG‐terminated SAMs on silica surfaces during XPS characterization. (17th April 2015)

Authors:
Palazon, Francisco; Géhin, Thomas; Ferrah, Djawhar; Garnier, Anaïs; Botella, Claude; Grenet, Geneviève; Souteyrand, Éliane; Cloarec, Jean‐Pierre; Chevolot, Yann
Journal:
Surface and interface analysis
Issue:
Volume 47:Number 6(2015)
Page Start:
719
Record Type:
Journal Article
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