Author/Creator: Borgoni, Riccardo - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Borgoni, Riccardo

1. 'Statistics for microelectronics', ASMBI, v. 29, issue 4, July/August 2013, pages 315–318. (24th October 2013)

Authors:: Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 30:Number 4(2014:Jul./Aug.)
Page Start:: 517
Record Type:: Journal Article
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2. A virtual metrology system based on least angle regression and statistical clustering. (17th September 2012)

Authors:: Susto, Gian Antonio; Beghi, Alessandro; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 29:Number 4(2013:Jul./Aug.)
Page Start:: 362
Record Type:: Journal Article
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3. Determining the target value of ACICD to optimize the electrical characteristics of semiconductors using dual response surface optimization. (26th March 2013)

Authors:: Lee, Dong‐Hee; Kim, Kwang‐Jae; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 29:Number 4(2013:Jul./Aug.)
Page Start:: 377
Record Type:: Journal Article
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4. Handling Heterogeneity in Assessing Residential Satisfaction. Issue 3 (18th June 2020)

Authors:: Borgoni, Riccardo; Michelangeli, Alessandra; Pirola, Federica
Journal:: Geographical analysis
Issue:: Volume 53:Issue 3(2021)
Page Start:: 447
Record Type:: Journal Article
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5. Identification of spatial defects in semiconductor manufacturing. (23rd March 2021)

Authors:: Borgoni, Riccardo; Galimberti, Chiara; Zappa, Diego
Other Names:: Berni Rossella guestEditor.; Fidalgo Jesús Fernando López guestEditor.; Vining Geoff G. guestEditor.
Journal:: Applied stochastic models in business and industry
Issue:: Volume 37:Number 5(2021)
Page Start:: 878
Record Type:: Journal Article
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6. Industrial statistics applications in the semiconductor industry: some examples. (11th December 2012)

Authors:: Kenett, Ron S.; Zacks, Shelemyahu; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 29:Number 4(2013:Jul./Aug.)
Page Start:: 319
Record Type:: Journal Article
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7. Kriging prediction from a circular grid: application to wafer diffusion. (22nd July 2013)

Authors:: Pistone, Giovanni; Vicario, Grazia; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 29:Number 4(2013:Jul./Aug.)
Page Start:: 350
Record Type:: Journal Article
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8. Mixed response surface models and Bayesian analysis of variance components for electrically conductive adhesives. (25th April 2013)

Authors:: Berni, Rossella; Scarano, Valeria Leonarda; Bertocci, Francesco; Catelani, Marcantonio; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego
Journal:: Applied stochastic models in business and industry
Issue:: Volume 29:Number 4(2013:Jul./Aug.)
Page Start:: 387
Record Type:: Journal Article
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9. Modelling the distribution of health-related quality of life of advanced melanoma patients in a longitudinal multi-centre clinical trial using M-quantile random effects regression. (February 2018)

Authors:: Borgoni, Riccardo; Del Bianco, Paola; Salvati, Nicola; Schmid, Timo; Tzavidis, Nikos
Journal:: Statistical methods in medical research
Issue:: Volume 27:Number 2(2018)
Page Start:: 549
Record Type:: Journal Article
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10. Model‐based process capability indices: The dry‐etching semiconductor case study. (16th July 2020)

Authors:: Borgoni, Riccardo; Zappa, Diego
Journal:: Quality and reliability engineering international
Issue:: Volume 36:Number 7(2020)
Page Start:: 2309
Record Type:: Journal Article
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