1. The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis. (August 2019) Authors: Wang, BinBin; Esser, Bryan D.; Bagués, Nuria; Yan, Jiaqiang; Blumer, Ari N.; McComb, David W. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 230 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. (August 2019) Authors: Blumer, Ari N.; Boyer, Jacob T.; Deitz, Julia I.; Rodriguez, Francisco A.; Grassman, Tyler J. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 202 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. EBSD of Rough Native CuInGaSe2 Thin-Films. (August 2021) Authors: Baan, Marzieh; Blumer, Ari N.; Grassman, Tyler J. Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 3442 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Concurrent Growth and Formation of Electrically Contacted Monolayer Transition Metal Dichalcogenides on Bulk Metallic Patterns. Issue 4 (20th October 2016) Authors: Khadka, Sudiksha; Lindquist, Miles; Aleithan, Shrouq H.; Blumer, Ari N.; Wickramasinghe, Thushan E.; Kordesch, Martin E.; Stinaff, Eric Journal: Advanced materials interfaces Issue: Volume 4:Issue 4(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Chemical Vapor Deposition: Concurrent Growth and Formation of Electrically Contacted Monolayer Transition Metal Dichalcogenides on Bulk Metallic Patterns (Adv. Mater. Interfaces 4/2017). Issue 4 (February 2017) Authors: Khadka, Sudiksha; Lindquist, Miles; Aleithan, Shrouq H.; Blumer, Ari N.; Wickramasinghe, Thushan E.; Kordesch, Martin E.; Stinaff, Eric Journal: Advanced materials interfaces Issue: Volume 4:Issue 4(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗