1. EP-1603: Improved performance of the Varian TrueBeam Portal Dosimetry system for large fields. (April 2016) Authors: Beyer, G.; Houston, P.; Goodyear, L.; Davies, P.; McLellan, J. Journal: Radiotherapy and oncology Issue: Volume 119(2016)Supplement 1 Page Start: S745 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. EP-1743: Comparison of IBA Stealth with CC13 for use as reference detector in beam data scanning. (April 2018) Authors: Beyer, G.; Hindocha, N.; Paiva, R.; Abushena, N.; Patel, R.; Mateus, D. Journal: Radiotherapy and oncology Issue: Volume 127(2018)Supplement 1 Page Start: S933 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. EP-1818: TrueBeam HDMLC DLG: Relationship between measured value and modeled Eclipse value in dose measurements. (April 2018) Authors: Beyer, G.; Stacey, C.; Rizkalla, S.; Bodey, R.; Blythe, K.; Hindocha, N.; Greener, T.; Johnson, U. Journal: Radiotherapy and oncology Issue: Volume 127(2018)Supplement 1 Page Start: S979 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. EP-2183: Dosimetric evaluation of Halcyon data – experience of the early implementers. (April 2018) Authors: Ghebremariam, G.; Beyer, G.; Crees, L.; Hulley, R. Journal: Radiotherapy and oncology Issue: Volume 127(2018)Supplement 1 Page Start: S1206 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Epitaxial Growth of Active Si on Top of SiGe Etch Stop Layer in View of 3D Device Integration. (13th January 2021) Authors: Loo, R.; Jourdain, A.; Rengo, G.; Porret, C.; Hikavyy, A.; Liebens, M.; Becker, L.; Storck, P.; Beyer, G.; Beyne, E. Journal: ECS journal of solid state science and technology Issue: Volume 10:Number 1(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Film Characterization of Low-Temperature Silicon Carbon Nitride for Direct Bonding Applications. (23rd December 2020) Authors: Nagano, F.; Iacovo, S.; Phommahaxay, A.; Inoue, F.; Sleeckx, E.; Beyer, G.; Beyne, E.; De. Gendt, S. Journal: ECS journal of solid state science and technology Issue: Volume 9:Number 12(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance. (1st March 2023) Authors: Nagano, F.; Inoue, F.; Phommahaxay, A.; Peng, L.; Chancerel, F.; Naser, H.; Beyer, G.; Uedono, A.; Beyne, E.; De. Gendt, S.; Iacovo, S. Journal: ECS journal of solid state science and technology Issue: Volume 12:Number 3(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance. (2nd March 2023) Authors: Nagano, F.; Inoue, F.; Phommahaxay, A.; Peng, L.; Chancerel, F.; Naser, H.; Beyer, G.; Uedono, A.; Beyne, E.; De. Gendt, S.; Iacovo, S. Journal: ECS journal of solid state science and technology Issue: Volume 12:Number 3(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance. (2nd March 2023) Authors: Nagano, F.; Inoue, F.; Phommahaxay, A.; Peng, L.; Chancerel, F.; Naser, H.; Beyer, G.; Uedono, A.; Beyne, E.; De. Gendt, S.; Iacovo, S. Journal: ECS journal of solid state science and technology Issue: Volume 12:Number 3(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance. (2nd March 2023) Authors: Nagano, F.; Inoue, F.; Phommahaxay, A.; Peng, L.; Chancerel, F.; Naser, H.; Beyer, G.; Uedono, A.; Beyne, E.; De. Gendt, S.; Iacovo, S. Journal: ECS journal of solid state science and technology Issue: Volume 12:Number 3(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗