1. (Invited) Evaluation of Stacked Nanowires Transistors for CMOS: Performance and Technology Opportunities. (4th May 2016) Authors: Gaben, Loïc; Barraud, Sylvain; Samson, Marie-Pierre; Jaud, Marie-Anne; Martinie, Sébastien; Rozeau, Olivier; Lacord, Joris; Arvet, Christian; Vizioz, Christian; Bustos, Jessy; Dallery, Jacques-Alexandre; Pauliac, Sébastien; Balan, Viorel; Euvrard-Colnat, Catherine; Perrot, Cédric; Loup, Virginie;... Journal: ECS transactions Issue: Volume 72:Number 4(2016) Page Start: 43 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut™ Technology. (18th August 2016) Authors: Widiez, Julie; Veytizou, Christelle; Hartmann, Jean-Michel; Loup, Virginie; Besson, Pascal; Baumel, Nicolas; Figuet, Christophe; Huyet, Isabelle; Mazen, Frédéric; Schwarzenbach, Walter; Tempesta, Catherine; Ecarnot, Ludovic Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 79 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Transfer of Ultra-Thin Semi-Conductor Films onto Flexible Substrates. (24th August 2016) Authors: Montméat, Pierre; De Nigris Brandolisi, Isadora; Tardif, Samuel; Enot, Thierry; Enyedi, Gregory; Kachtouli, Riadh; Besson, Pascal; Rieutord, François; Fournel, Frank Journal: ECS transactions Issue: Volume 75:Number 9(2016) Page Start: 247 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗