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You searched for: Author/Creator Beerel, Peter A.Limit your search
- Beerel, Peter A. [remove] 1
- 621.39 1
- Computer architecture -- Periodicals 1
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- Digital electronics -- Periodicals 1
- Monte Carlo methods -- integrated circuit design -- integrated circuit testing -- clocks -- integrated circuit yield -- combinational circuits -- mathematical analysis -- logic gates -- delay lines 1
- delay line -- Monte Carlo analysis -- bundled data -- ring‐oscillator -- bundled‐data designs -- shipped product quality -- process‐voltage‐temperature variations -- OR‐based clocks -- mathematical analysis -- combinational logic -- OR‐based circuits -- size 65.0 nm 1