Search

Search Constraints

You searched for: Author/Creator Bauers, Sage R.

Search Results

1. Boron Phosphide Films by Reactive Sputtering: Searching for a P‐Type Transparent Conductor. Issue 12 (27th February 2022)

4. Erratum: Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride [ECS J. Solid State Sci. Technol., 6, N189 (2017)]. (1st January 2018)

5. Erratum: Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride [ECS J. Solid State Sci. Technol., 6, N189 (2017)]. (24th April 2018)

6. Influence of hydrogen and oxygen on the structure and properties of sputtered magnesium zirconium oxynitride thin films. Issue 18 (4th May 2020)

8. Reactive phosphine combinatorial co-sputtering of cation disordered ZnGeP2 films. Issue 3 (17th December 2021)

9. Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride. (1st January 2017)

10. Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride. (5th October 2017)