Author/Creator: Bastos, Rodrigo Possamai - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Bastos, Rodrigo Possamai

1. Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology. Issue 9 (August 2015)

Authors:: Rolloff, Otto Aureliano; Bastos, Rodrigo Possamai; Fesquet, Laurent
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1302
Record Type:: Journal Article
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2. Impact of radiation-induced soft error on embedded cryptography algorithms. (November 2021)

Authors:: Bandeira, Vitor; Sampford, Jack; Garibotti, Rafael; Trindade, Matheus Garay; Bastos, Rodrigo Possamai; Reis, Ricardo; Ost, Luciano
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
Page Start:
Record Type:: Journal Article
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3. Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU. (November 2022)

Authors:: Benevenuti, Fabio; Gonçalves, Marcio M.; Pereira, Evaldo Carlos F.; Vaz, Rafael G.; Gonçalez, Odair L.; Bastos, Rodrigo Possamai; Letiche, Manon; Kastensmidt, Fernanda L.; Azambuja, José Rodrigo
Journal:: Microelectronics and reliability
Issue:: Volume 138(2022)
Page Start:
Record Type:: Journal Article
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4. On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits. (©2020)

Other Names:: Bastos, Rodrigo Possamai; Torres, Frank Sill
Record Type:: Book
Extent:: 1 online resource (187 pages)
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5. Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors. (November 2017)

Authors:: de Oliveira Rocha, Raphael; Sill Torres, Frank; Bastos, Rodrigo Possamai
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 190
Record Type:: Journal Article
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