1. 3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite. (August 2014) Authors: Bassim, N.D.; Stroud, R. M.; Scott, K.; Nittler, L. R.; Herd, C. D. K. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 318 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite. (August 2014) Authors: Bassim, N.D.; Stroud, R. M.; Scott, K.; Nittler, L. R.; Herd, C. D. K. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 318 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications. (August 2014) Authors: Marsh, M.P.; Scott, K.; Stroud, R.M.; Bassim, N.D. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 770 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications. (August 2014) Authors: Marsh, M.P.; Scott, K.; Stroud, R.M.; Bassim, N.D. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 770 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures. (August 2014) Authors: Katz, M.B.; Twigg, M.E.; Maximenko, S.I.; Bassim, N.D.; Mahadik, N.A.; Jernigan, G.G.; Canedy, C.L.; Abell, J.; Affouda, C.A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1064 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures. (August 2014) Authors: Katz, M.B.; Twigg, M.E.; Maximenko, S.I.; Bassim, N.D.; Mahadik, N.A.; Jernigan, G.G.; Canedy, C.L.; Abell, J.; Affouda, C.A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1064 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. STEM-EDXS System for Atomic-Sensitivity Elemental Mapping. (23rd September 2015) Authors: Lovejoy, T.C.; Stroud, R.M.; Bassim, N.D.; Corbin, G.J.; Dellby, N.; Hahn, W.; Hrncirik, P.; Falke, M.; Kaeppel, A.; Rohde, M.; Krivanek, O.L. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 339 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. STEM-EDXS System for Atomic-Sensitivity Elemental Mapping. (August 2015) Authors: Lovejoy, T.C.; Stroud, R.M.; Bassim, N.D.; Corbin, G.J.; Dellby, N.; Hahn, W.; Hrncirik, P.; Falke, M.; Kaeppel, A.; Rohde, M.; Krivanek, O.L. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 339 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗