Author/Creator: Basler, T. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Basler, T.

1. Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs. (November 2021)

Authors:: Gerlach, M.; Boldyrjew-Mast, R.; Bruchhold, F.; Lutz, J.; Basler, T.; Schwarzmann, H.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress. (September 2019)

Authors:: Palanisamy, S.; Ahmmed, Md.K.; Kowalsky, J.; Lutz, J.; Basler, T.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Ruggedness of 1200 V SiC MPS diodes. Issue 9 (August 2015)

Authors:: Fichtner, S.; Frankeser, S.; Lutz, J.; Rupp, R.; Basler, T.; Gerlach, R.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1677
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗