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Author/Creator Barnes, J. P.

3. Impact of UV Nanosecond Laser Annealing on Composition and Strain of Undoped Si0.8Ge0.2 Epitaxial Layers. (15th April 2019)

Authors:
Dagault, L.; Acosta-Alba, P.; Kerdilès, S.; Barnes, J. P.; Hartmann, J. M.; Gergaud, P.; Nguyen, T. T.; Grenier, A.; Papon, A. M.; Bernier, N.; Delaye, V.; Aubin, J.; Cristiano, F.
Journal:
ECS journal of solid state science and technology
Issue:
Volume 8:Number 3(2019)
Page Start:
P202
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. Impact of UV Nanosecond Laser Annealing on Composition and Strain of Undoped Si0.8Ge0.2 Epitaxial Layers. (1st January 2019)

Authors:
Dagault, L.; Acosta-Alba, P.; Kerdilès, S.; Barnes, J. P.; Hartmann, J. M.; Gergaud, P.; Nguyen, T. T.; Grenier, A.; Papon, A. M.; Bernier, N.; Delaye, V.; Aubin, J.; Cristiano, F.
Journal:
ECS journal of solid state science and technology
Issue:
Volume 8:Number 3(2019)
Page Start:
P202
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

5. ToF‐SIMS spectra multivariate analyses for the chemical characterization of microelectronic low‐k materials. (7th May 2014)

Authors:
Scarazzini, R.; Lépinay, M.; Broussous, L.; Barnes, J. P.; Veillerot, M.; Jousseaume, V.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun
Journal:
Surface and interface analysis
Issue:
Volume 46:Number 1(2014:Jan.)
Page Start:
213
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗