Very Low Temperature Epitaxy of Heavily In Situ Phosphorous Doped Ge Layers and High Sn Content GeSn Layers. (13th December 2016)
- Record Type:
- Journal Article
- Title:
- Very Low Temperature Epitaxy of Heavily In Situ Phosphorous Doped Ge Layers and High Sn Content GeSn Layers. (13th December 2016)
- Main Title:
- Very Low Temperature Epitaxy of Heavily In Situ Phosphorous Doped Ge Layers and High Sn Content GeSn Layers
- Authors:
- Aubin, J.
Hartmann, J. M.
Barnes, J. P.
Pin, J. B.
Bauer, M. - Abstract:
- Abstract : We have studied in the 300–350°C temperature range, the 100 Torr epitaxy of heavily in-situ phosphorous doped Ge and high Sn content GeSn alloys in a 200 mm industrial Reduced Pressure - Chemical Vapor Deposition tool. We have first of all quantified the impact of the phosphine (PH3 ) flow on the structural and electrical properties of Ge:P layers. To that end, we have used a dedicated low temperature Ge precursor, digermane (Ge2 H6 ), in order to promote P incorporation. We have reached very high atomic and electrically active P concentrations, at most 5 × 10 20 cm −3 and 7.5 × 10 19 cm −3, respectively. We have then evaluated the impact of the Ge2 H6 and SnCl4 flows on the GeSn growth kinetics at 325°C, 100 Torr. As expected, the GeSn growth rate increases almost linearly with the Sn concentration, from 5 up to 21 nm.min −1 . The Sn atoms seem to catalyze H desorption from the surface, resulting in higher GeSn growth rates, then. Finally, we have studied the impact of temperature, in the 300–350°C range, on the GeSn growth kinetics. The GeSn growth rate exponentially increases with the temperature, from 15 up to 32 nm.min −1 . The associated activation energy is low, e.g. Ea = 11 kcal.mol −1 . Really high Sn concentrations (at most 15%) were obtained in smooth, single crystalline layers.
- Is Part Of:
- ECS journal of solid state science and technology. Volume 6:Number 1(2017)
- Journal:
- ECS journal of solid state science and technology
- Issue:
- Volume 6:Number 1(2017)
- Issue Display:
- Volume 6, Issue 1 (2017)
- Year:
- 2017
- Volume:
- 6
- Issue:
- 1
- Issue Sort Value:
- 2017-0006-0001-0000
- Page Start:
- P21
- Page End:
- P26
- Publication Date:
- 2016-12-13
- Subjects:
- digermane -- GeSn growth kinetics -- high Sn content GeSn alloys -- in-Situ Phosphorous doping of Germanium -- phosphine -- Reduced-Pressure Chemical Vapor Deposition -- tin tetrachloride -- very low temperature epitaxy
Solid state chemistry -- Periodicals
Electronics -- Materials -- Periodicals
Electrochemistry -- Periodicals
541.0421 - Journal URLs:
- https://iopscience.iop.org/journal/2162-8777 ↗
http://www.electrochem.org/ ↗ - DOI:
- 10.1149/2.0091701jss ↗
- Languages:
- English
- ISSNs:
- 2162-8777
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
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- 15449.xml