1. A differential OTP memory based highly unique and reliable PUF at 180 nm technology node. (February 2022) Authors: Malviya, P.; Sadana, S.; Lele, A.; Priyadarshi, K.; Sharma, A.; Naik, A.; Bandhu, L.; Bende, A.; Tsundus, S.; Kumar, S.; Singh, V.P.; Chawla, A.; Chawla, P.; Singh, A.; Sehgal, D.; Kumar, A.; Uddin, W.; Chatterjee, S.; Suri, M.; Jatana, H.S. Journal: Solid-state electronics Issue: Volume 188(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗