1. Accurate exponential histogram test method for ADC linearity test. Issue 12 (1st June 2020) Authors: Wu, Minshun; Ban, Cheng; Guo, Yi; Xu, Jiangtao; Geng, Li Journal: Electronics letters Issue: Volume 56:Issue 12(2020) Page Start: 607 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗