Accurate exponential histogram test method for ADC linearity test. Issue 12 (1st June 2020)

• Record Type: Journal Article
• Authors: Wu, Minshun; Ban, Cheng; Guo, Yi; Xu, Jiangtao; Geng, Li
• Is Part Of: Electronics letters. Volume 56:Issue 12(2020)
• Page Start: 607
• Page End: 609
• Publication Date: 2020-06-01
• Subjects: circuit testing -- analogue‐digital conversion; ADC linearity test -- accurate exponential histogram test method -- conventional EHT methods -- ADC static parameters -- ADC transition levels -- code width -- integral nonlinearity -- differential nonlinearity; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2020.0180
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : An accurate exponential histogram test (EHT) method is proposed for the ADC linearity test. Different from conventional EHT methods which estimate ADC static parameters only based on the number of hits, the proposed method accurately estimates the ADC transition levels, differential non‐linearity and integral non‐linearity by creative utilisation of the information of stimulus signal. As a result, the proposed method avoids the errors introduced by the assumed proportional relationship between the code width and the number of hits in conventional methods. Simulation results show that the proposed method outperforms the conventional methods in terms of accuracy and robustness.