Author/Creator: Bak, Geunyong - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Bak, Geunyong

1. A theoretical and experimental investigation of Bragg's rule for energy-loss straggling in low mean energy loss regime in air and its constituents. (January 2021)

Authors:: Qasim, Mirza Hussain Raza; Shahzadi, Nosheen; Bak, Geunyong; Baeg, Sanghyeon
Journal:: Vacuum
Issue:: Volume 183(2021)
Page Start:
Record Type:: Journal Article
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2. An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. (February 2017)

Authors:: Khan, Saqib Ali; Lim, Chulseung; Bak, Geunyong; Baeg, Sanghyeon; Lee, Soonyoung
Journal:: Microelectronics and reliability
Issue:: Volume 69(2017)
Page Start:: 100
Record Type:: Journal Article
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3. Failure signature analysis of power-opens in DDR3 SDRAMs. (September 2018)

Authors:: Li, Tan; Lee, Hosung; Bak, Geunyong; Baeg, Sanghyeon
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 277
Record Type:: Journal Article
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4. FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor. (November 2020)

Authors:: Waqar, Muhammad; Baeg, Sanghyeon; Bak, Geunyong; Kwon, Junhyeong; Lee, Kiseok; Jeon, Sang Hoon
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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5. Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. (January 2018)

Authors:: Lim, Chulseung; Park, Kyungbae; Bak, Geunyong; Yun, Donghyuk; Park, Myungsang; Baeg, Sanghyeon; Wen, Shi-Jie; Wong, Richard
Journal:: Microelectronics and reliability
Issue:: Volume 80(2018)
Page Start:: 85
Record Type:: Journal Article
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