Author/Creator: Azzopardi, S. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Azzopardi, S.

1. Ageing mechanisms in Deep Trench Termination (DT2) Diode. Issue 9 (August 2015)

Authors:: Baccar, F.; Arbess, H.; Theolier, L.; Azzopardi, S.; Woirgard, E.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1981
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Identification and analysis of power substrates degradations subjected to severe aging tests. Issue 9 (August 2015)

Authors:: Woirgard, E.; Arabi, F.; Sabbah, W.; Martineau, D.; Theolier, L.; Azzopardi, S.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1961
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Is it ever safe to closely monitor involved margins in early and late stage oral squamous cell carcinoma?. Issue 10 (December 2015)

Authors:: Azzopardi, S.; Basyuni, S.; Rogers, S.
Journal:: British journal of oral and maxillofacial surgery
Issue:: Volume 53:Issue 10(2015)
Page Start:: e47
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Mechanical stress investigation after technological process in Deep Trench Termination DT2 using BenzoCycloButene as dielectric material. Issue 9 (August 2015)

Authors:: Arbess, H.; Baccar, F.; Theolier, L.; Azzopardi, S.; Woirgard, E.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 2017
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Power modules die attach: A comprehensive evolution of the nanosilver sintering physical properties versus its porosity. Issue 9 (August 2015)

Authors:: Youssef, T.; Rmili, W.; Woirgard, E.; Azzopardi, S.; Vivet, N.; Martineau, D.; Meuret, R.; Le Quilliec, G.; Richard, C.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1997
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Thermal aging of power module assemblies based on ceramic heat sink and multilayers pressureless silver sintering. (November 2021)

Authors:: Botter, N.; Khazaka, R.; Avenas, Y.; Missiaen, J.M.; Bouvard, D.; Azzopardi, S.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗