Author/Creator: Autran, J.-L. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Autran, J.-L.

1. Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. (September 2018)

Authors:: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Touboul, A.D.; Pouget, V.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 920
Record Type:: Journal Article
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2. Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation. (November 2020)

Authors:: Schvittz, R.B.; Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Rosa, L.S.; Butzen, P.F.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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3. Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications. (November 2020)

Authors:: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Pouget, V.; Touboul, A.D.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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4. Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells. (September 2019)

Authors:: Aguiar, Y.Q.; Wrobel, F.; Guagliardo, S.; Autran, J.-L.; Leroux, P.; Saigné, F.; Touboul, A.D.; Pouget, V.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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5. Reliability-driven pin assignment optimization to improve in-orbit soft-error rate. (November 2020)

Authors:: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Pouget, V.; Touboul, A.D.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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6. Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge. (April 2021)

Authors:: Guagliardo, S.; Wrobel, F.; Aguiar, Y.Q.; Autran, J.-L.; Leroux, P.; Saigné, F.; Pouget, V.; Touboul, A.D.
Journal:: Microelectronics and reliability
Issue:: Volume 119(2021)
Page Start:
Record Type:: Journal Article
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