1. (Invited) Modelling and Simulation of Advanced Semiconductor Devices. (1st August 2017) Authors: Adamu-Lema, Fikru; Duan, Meng; Berrada, Salim; Lee, Jaehyun; Al-Ameri, T.; Georgiev, Vihar; Asenov, Asen Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 33 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Process Variability for Devices at and Beyond the 7 nm Node. (10th April 2018) Authors: Lorenz, Juergen Klaus; Asenov, Asen; Baer, Eberhard; Barraud, Sylvain; Millar, Campbell; Nedjalkov, Mihail Journal: ECS transactions Issue: Volume 85:Number 8(2018) Page Start: 113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices. Issue 1 (1998) Authors: Arokianathan, Clinton R.; Asenov, Asen; Davies, John H. Journal: VLSI design Issue: Volume 6:Issue 1/4(1998) Page Start: 243 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Editorial. (June 2016) Authors: Asenov, Asen; Schichtmann, Ulf; Tan, Cher Ming; Wong, Hei; Zhou, Xing Journal: Microelectronics and reliability Issue: Volume 61(2016) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Full-band quantum transport simulation in the presence of hole-phonon interactions using a mode-space k·p approach. (14th October 2020) Authors: Carrillo-Nuñez, Hamilton; Medina-Bailón, Cristina; Georgiev, Vihar P; Asenov, Asen Journal: Nanotechnology Issue: Volume 32:Number 2(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Hierarchical simulation of nanosheet field effect transistor: NESS flow. (January 2023) Authors: Nagy, Daniel; Rezaei, Ali; Xeni, Nikolas; Dutta, Tapas; Adamu-Lema, Fikru; Topaloglu, Ismail; Georgiev, Vihar P.; Asenov, Asen Journal: Solid-state electronics Issue: Volume 199(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit. (March 2017) Authors: Al-Ameri, Talib; Georgiev, Vihar P.; Sadi, Toufik; Wang, Yijiao; Adamu-Lema, Fikru; Wang, Xingsheng; Amoroso, Salvatore M.; Towie, Ewan; Brown, Andrew; Asenov, Asen Journal: Solid-state electronics Issue: Volume 129(2017) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Improved compact model extraction of statistical variability in 5 nm nanosheet transistors and applied to SRAM simulations. (1st September 2022) Authors: Li, Ruihan; Luo, Haowen; Wang, Yichen; Yuan, Zhengwu; Asenov, Asen; Miao, Xiangshui; Wang, Xingsheng Journal: Semiconductor science and technology Issue: Volume 37:Number 9(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Investigation of inversion, accumulation and junctionless mode bulk Germanium FinFETs. (November 2017) Authors: Thirunavukkarasu, Vasanthan; Lee, Jaehyun; Sadi, Toufik; Georgiev, Vihar P.; Lema, Fikru-Adamu; Soundarapandian, Karuppasamy Pandian; Jhan, Yi-Ruei; Yang, Shang-Yi; Lin, Yu-Ru; Kurniawan, Erry Dwi; Wu, Yung-Chun; Asenov, Asen Journal: Superlattices and microstructures Issue: Volume 111(2017) Page Start: 649 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Investigation of resistance switching in SiOx RRAM cells using a 3D multi-scale kinetic Monte Carlo simulator. (5th February 2018) Authors: Sadi, Toufik; Mehonic, Adnan; Montesi, Luca; Buckwell, Mark; Kenyon, Anthony; Asenov, Asen Journal: Journal of physics Issue: Volume 30:Number 8(2018) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗