1. A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation. Issue 1670 (17th June 2014) Authors: Sopori, Bhushan; Devayajanam, Srinivas; Basnyat, Prakash; Mehta, Vishal; Moutinho, Helio; Nemeth, Bill; LaSalvia, Vincenzo; Johnston, Steve; Ravindra, N.M.; Binns, Jeff; Appel, Jesse Journal: MRS proceedings Issue: Issue 1670:(2014) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Experimental study to separate surface and bulk contributions of light-induced degradation in crystalline silicon solar cells. Issue 2 (20th August 2015) Authors: Basnyat, Prakash; Sopori, Bhushan; Devayajanam, Srinivas; Shet, Sudhakar; Binns, Jeff; Appel, Jesse; Ravindra, Nuggehalli M. Journal: Emerging materials research Issue: Volume 4:Issue 2(2015) Page Start: 239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Impact of the injection‐level‐dependent lifetime on Voc, FF, ideality m, J02, and the dim light response in a commercial PERC cell. (21st June 2016) Authors: Hieslmair, Henry; Appel, Jesse; Kasthuri, Jai; Guo, Jason; Johnson, Bayard; Binns, Jeff Journal: Progress in photovoltaics Issue: Volume 24:Number 11(2016) Page Start: 1448 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters. Issue 1770 (2015) Authors: Sopori, Bhushan; Devayajanam, Srinivas; Basnyat, Prakash; Schnepf, Rekha; Sahoo, Santosh; Gee, James; Severico, Ferdinando; Seigneur, Hubert; Schoenfeld, Winston V.; Preece, Steve; Binns, Jeff; Appel, Jesse; VanSant, Kaitlyn Editors: Hekmatshoar, B.; Collins, R.; Holman, Z.; Stradins, P.; Terakawa, A. Journal: MRS proceedings Issue: Issue 1770(2015) Page Start: 61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗