1. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Characterization of fully silicided source/drain SOI UTBB nMOSFETs at cryogenic temperatures. (June 2022) Authors: Han, Yi; Xi, Fengben; Allibert, Frederic; Radu, Ionut; Prucnal, Slawomir; Bae, Jin-Hee; Hoffmann-Eifert, Susanne; Knoch, Joachim; Grützmacher, Detlev; Zhao, Qing-Tai Journal: Solid-state electronics Issue: Volume 192(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Impact of substrate resistivity on spiral inductors at mm-wave frequencies. (August 2022) Authors: Nyssens, Lucas; Rack, Martin; Schwan, Christoph; Zhao, Zhixing; Lehmann, Steffen; Hermann, Tom; Allibert, Frederic; Aulnette, Cécile; Lederer, Dimitri; Raskin, Jean-Pierre Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability. (March 2016) Authors: Schwarzenbach, Walter; Nguyen, Bich-Yen; Allibert, Frederic; Girard, Christophe; Maleville, Christophe Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 2 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability. (March 2016) Authors: Schwarzenbach, Walter; Nguyen, Bich-Yen; Allibert, Frederic; Girard, Christophe; Maleville, Christophe Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 2 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗