1. A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development. (November 2021) Authors: Alepidis, M.; Ionica, I.; Milesi, F.; Bresson, N.; Gaudin, G.; Cristoloveanu, S.; Reboh, S. Journal: Solid-state electronics Issue: Volume 185(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗