1. Investigation of the evolution of nitrogen defects in flash-lamp-annealed InGaZnO films and their effects on transistor characteristics. (22nd May 2018) Authors: Eom, Tae-Yil; Ahn, Chee-Hong; Kang, Jun-Gu; Salman, Muhammad Saad; Lee, Sun-Young; Kim, Yong-Hoon; Lee, Hoo-Jeong; Kang, Chan-Mo; Kang, Chiwon Journal: Applied physics express Issue: Volume 11:Number 6(2018) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗