Detecting anomalies in X-ray diffraction images using convolutional neural networks. (15th July 2021)
- Record Type:
- Journal Article
- Title:
- Detecting anomalies in X-ray diffraction images using convolutional neural networks. (15th July 2021)
- Main Title:
- Detecting anomalies in X-ray diffraction images using convolutional neural networks
- Authors:
- Czyzewski, Adam
Krawiec, Faustyna
Brzezinski, Dariusz
Porebski, Przemyslaw Jerzy
Minor, Wladek - Abstract:
- Highlights: End-to-end anomaly detection system for X-ray diffraction images. Beam center detection algorithm. Comparison of three alternative image representation approaches. Open multi-label classification dataset of 6, 311 diffraction images. Abstract: Our understanding of life is based upon the interpretation of macromolecular structures and their dynamics. Almost 90% of currently known macromolecular models originated from electron density maps constructed using X-ray diffraction images. Even though diffraction images are critical for structure determination, due to their vast amounts and noisy, non-intuitive nature, their quality is rarely inspected. In this paper, we use recent advances in machine learning to automatically detect seven types of anomalies in X-ray diffraction images. For this purpose, we utilize a novel X-ray beam center detection algorithm, propose three different image representations, and compare the predictive performance of general-purpose classifiers and deep convolutional neural networks (CNNs). In benchmark tests on a set of 6, 311 X-ray diffraction images, the proposed CNN achieved between 87% and 99% accuracy depending on the type of anomaly. Experimental results show that the proposed anomaly detection system can be considered suitable for early detection of sub-optimal data collection conditions and malfunctions at X-ray experimental stations.
- Is Part Of:
- Expert systems with applications. Volume 174(2021)
- Journal:
- Expert systems with applications
- Issue:
- Volume 174(2021)
- Issue Display:
- Volume 174, Issue 2021 (2021)
- Year:
- 2021
- Volume:
- 174
- Issue:
- 2021
- Issue Sort Value:
- 2021-0174-2021-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-07-15
- Subjects:
- X-ray diffraction image -- Multi-label classification -- Convolutional neural network -- Image recognition -- Crystallography
Expert systems (Computer science) -- Periodicals
Systèmes experts (Informatique) -- Périodiques
Electronic journals
006.33 - Journal URLs:
- http://www.sciencedirect.com/science/journal/09574174 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.eswa.2021.114740 ↗
- Languages:
- English
- ISSNs:
- 0957-4174
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3842.004220
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 27091.xml