Impact of epitaxial strain on crystal field splitting of α-Cr2O3(0001) thin films quantified by X-ray photoemission spectroscopy. Issue 4 (3rd April 2021)

• Record Type: Journal Article
• Authors: Pinho, Pâmella Vasconcelos Borges; Chartier, Alain; Miserque, Frédéric; Menut, Denis; Moussy, Jean-Baptiste
• Is Part Of: Materials research letters. Volume 9:Issue 4(2021)
• Page Start: 163
• Page End: 168
• Publication Date: 2021-04-03
• Subjects: Cr2O3 -- crystal field splitting -- epitaxial strain -- X-ray photoemission spectroscopy -- crystal field multiplet calculations; Materials science -- Research -- Periodicals; Biomedical materials -- Research -- Periodicals; Composite materials -- Research -- Periodicals; Biomedical materials -- Research; Composite materials -- Research; Materials science -- Research; Periodicals; 620.1105
• DOI: 10.1080/21663831.2020.1863877
• Languages: English
• ISSNs: 2166-3831

Abstract

Abstract : The influence of epitaxial strain on the electronic structure of α-Cr2 O3 (0001) thin films is probed by combining X-ray photoemission spectroscopy and crystal field multiplet calculations. In-plane lattice strain introduces distortions in the CrO6 octahedron and splits the 3d orbital triplet t2g into a1 + e orbitals. For relaxed thin films, the lines-shape of the Cr 2 p core levels are well reproduced when the t2g subset is fully degenerated. In-plane tensile strain stabilizes a1 with respect to e orbitals, whereas compressive strain destabilizes a1 orbitals. Understanding these crystal field variations is essential for tuning the physical properties of α-Cr2 O3 thin films. GRAPHICAL ABSTRACT: