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HARVARD Citation
Tian, H. et al. (2023). Evaluation of SEU impact on convolutional neural networks based on BRAM and CRAM in FPGAs. Microelectronics and reliability. p. . [Online].
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Tian, H. et al. (2023). Evaluation of SEU impact on convolutional neural networks based on BRAM and CRAM in FPGAs. Microelectronics and reliability. p. . [Online].