On reliability analysis of one-shot devices with manufacturing defects. Issue Volume 35:Issues 1(2023) (2nd January 2023)

• Record Type: Journal Article
• Authors: Shang, Xiangwen; Ng, Hon Keung Tony; Ling, Man Ho
• Is Part Of: Quality engineering. Volume 35:Issues 1(2023)
• Page Start: 79
• Page End: 94
• Publication Date: 2023-01-02
• Subjects: defects -- gamma distribution -- masking -- maximum likelihood estimators -- one-shot device -- Weibull distribution; Quality control -- Periodicals; Production management -- Quality control -- Periodicals; 658.5
• DOI: 10.1080/08982112.2022.2089855
• Languages: English
• ISSNs: 0898-2112

Abstract

Abstract: One-shot device test data have attracted increased attention. The working condition of a one-shot device is unknown until testing the device. In this paper, we consider one-shot device test data with defects that are induced in a realistic manufacturing process. The maximum likelihood approach is proposed for estimating the mean-time-to-failure. In this study, masked data are also considered when we cannot distinguish whether a failed device is originally defective or not. A Monte Carlo simulation study is conducted to evaluate the impacts of the masking effect on the estimation under different settings. Some practical guidelines and recommendations are provided.