Cite
HARVARD Citation
Raut, P. et al. (2023). Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions. Microelectronics journal. p. . [Online].
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Raut, P. et al. (2023). Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions. Microelectronics journal. p. . [Online].