Cite
HARVARD Citation
Thoutam, L. et al. (2023). A critical review of fabrication challenges and reliability issues in top/bottom gated MoS2 field-effect transistors. Nanotechnology. p. . [Online].
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Thoutam, L. et al. (2023). A critical review of fabrication challenges and reliability issues in top/bottom gated MoS2 field-effect transistors. Nanotechnology. p. . [Online].