Resolving Oxidation States and X–site Composition of Sn Perovskites through Auger Parameter Analysis in XPS. Issue 7 (9th December 2022)

• Record Type: Journal Article
• Authors: Wieczorek, Alexander; Lai, Huagui; Pious, Johnpaul; Fu, Fan; Siol, Sebastian
• Is Part Of: Advanced materials interfaces. Volume 10:Issue 7(2023)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2022-12-09
• Subjects: Auger parameter -- semiconductors -- Sn perovskites -- Wagner plot -- XPS; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.202201828
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract: Reliable chemical state analysis of Sn semiconductors by XPS is hindered by the marginal observed binding energy shift in the Sn 3d region. For hybrid Sn‐based perovskites especially, errors associated with charge referencing can easily exceed chemistry‐related shifts. Studies based on the modified Auger parameter α ′ provide a suitable alternative and have been used previously to resolve different chemical states in Sn alloys and oxides. However, the meaningful interpretation of Auger parameter variations on Sn‐based perovskite semiconductors requires fundamental studies. In this work, a comprehensive Auger parameter study is performed through systematic compositional variations of Sn halide perovskites. It is found that in addition to the oxidation state, α ′ is highly sensitive to the composition of the halide site, inducing shifts of up to Δα ′ = 2 eV between ASnI3 and ASnBr3 type perovskites. The reported dependencies of α ′ on the Sn oxidation state, coordination and local chemistry provide a framework that enables reliable tracking of degradation as well as X ‐site composition for Sn‐based perovskites and related compounds. The higher robustness and sensitivity of such studies not only enables more in‐depth surface analysis of Sn‐based perovskites than previously performed, but also increases reproducibility across laboratories. Abstract : Reliable X‐Ray photoelectron spectroscopy (XPS) analysis on Sn‐based perovskites is hindered by charging effects and low chemical shifts between non‐metallic Sn states. Using Auger parameter analysis allows to overcome these challenges, resulting in more reliable and in‐depth surface analysis of Sn‐based perovskites. This method can be easily adopted using standard XPS equipment with minimal additional effort.