MAXPEEM: a spectromicroscopy beamline at MAX IV laboratory. (3rd February 2023)

• Record Type: Journal Article
• Authors: Niu, Yuran; Vinogradov, Nikolay; Preobrajenski, Alexei; Struzzi, Claudia; Sarpi, Brice; Zhu, Lin; Golias, Evangelos; Zakharov, Alexei
• Is Part Of: Journal of synchrotron radiation. Volume 30:Part 2(2023)
• Page Start: 468
• Page End: 478
• Publication Date: 2023-02-03
• Subjects: X‐ray photoelectron microscopy -- ACLEEM -- micro‐ARPES -- XMCD; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S160057752300019X
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : The design and performance of a new dedicated spectromicroscopy beamline at the Swedish national synchrotron (MAX IV) is presented. Abstract : MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state‐of‐the‐art aberration‐corrected spectroscopic photoemission and low‐energy electron microscope (AC‐SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single‐digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥10 15 photons s −1 (0.1% bandwidth) −1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X‐rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber‐coupled CMOS camera features an improved modulation transfer function, dynamic range and signal‐to‐noise ratio compared with the traditional MCP‐CCD detection system.