Cite
HARVARD Citation
Liu, D. et al. (2023). A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. Advanced Electronic Materials. p. n/a. [Online].
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Liu, D. et al. (2023). A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. Advanced Electronic Materials. p. n/a. [Online].