Cite
HARVARD Citation
Faurie, D. et al. (2019). In situ x-ray diffraction analysis of 2D crack patterning in thin films. Acta materialia. pp. 177-182. [Online].
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Faurie, D. et al. (2019). In situ x-ray diffraction analysis of 2D crack patterning in thin films. Acta materialia. pp. 177-182. [Online].