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HARVARD Citation
Keckes, J. et al. (2018). 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film. Acta materialia. pp. 862-873. [Online].
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Keckes, J. et al. (2018). 30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film. Acta materialia. pp. 862-873. [Online].