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HARVARD Citation
Treml, R. et al. (2016). High resolution determination of local residual stress gradients in single- and multilayer thin film systems. Acta materialia. pp. 616-623. [Online].
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Treml, R. et al. (2016). High resolution determination of local residual stress gradients in single- and multilayer thin film systems. Acta materialia. pp. 616-623. [Online].