Cite
HARVARD Citation
Jäger, N. et al. (2019). Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction. Acta materialia. pp. 55-66. [Online].
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Jäger, N. et al. (2019). Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction. Acta materialia. pp. 55-66. [Online].