In‐house texture measurement using a compact neutron source. Issue 2 (25th March 2020)

• Record Type: Journal Article
• Authors: Xu, Pingguang; Ikeda, Yoshimasa; Hakoyama, Tomoyuki; Takamura, Masato; Otake, Yoshie; Suzuki, Hiroshi
• Is Part Of: Journal of applied crystallography. Volume 53:Issue 2(2020)
• Page Start: 444
• Page End: 454
• Publication Date: 2020-03-25
• Subjects: compact neutron sources -- texture measurement -- neutron diffraction -- texture measurement reliability -- instrumental accessibility; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576720002551
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : The RIKEN compact neutron source and related neutron diffractometer were successfully upgraded for precise in‐house texture measurement, as judged by comparison with two other well established neutron diffractometers. This provides a good example for the technical development and the scientific application of neutron diffraction techniques based on compact neutron sources. Abstract : In order to improve the instrumental accessibility of neutron diffraction techniques, many emerging compact neutron sources and in‐house neutron diffractometers are being developed, even though the precision level of neutron diffraction experiments performed on such instruments was thought to be incomparable with that of large‐scale neutron facilities. As a challenging project, the RIKEN accelerator‐driven compact neutron source (RANS) was employed here to establish the technical environment for texture measurements, and the recalculated pole figures and orientation distribution functions of an interstitial‐free steel sheet obtained from RANS were compared with the results from another two neutron diffractometers well established for texture measurement. These quantitative comparisons revealed that the precise neutron diffraction texture measurement at RANS has been realized successfully, and the fine region division of the neutron detector panel is invaluable for improving the stereographic resolution of texture measurements. Moreover, through selectively using the parts of the obtained neutron diffraction patterns that exhibit good statistics, the Rietveld texture analysis improves the reliability of the texture measurement to a certain extent. These technical research results may accelerate the development of other easily accessible techniques for evaluation of engineering materials using compact neutron sources, and also help to improve the data‐collection efficiency for various time‐resolved scattering experiments at large‐scale neutron facilities.