Cite
HARVARD Citation
Arrighi, A. et al. (2023). A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. Nanotechnology. p. . [Online].
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Arrighi, A. et al. (2023). A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2 on SiO2. Nanotechnology. p. . [Online].