Cite
HARVARD Citation
Chauhan, V. et al. (2023). Estimation of performance degradation due to interface traps in the gate and spacer stack of NC-FinFET. Semiconductor science and technology. p. . [Online].
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Chauhan, V. et al. (2023). Estimation of performance degradation due to interface traps in the gate and spacer stack of NC-FinFET. Semiconductor science and technology. p. . [Online].